XCP-NG blk_update_request

Hi,

I have a Debian Bullseye VM running on XCP-NG v8.2.

On a 2TB SSD drive three virtual disks is created.

One of the virtual disks are attached to the VM.

The following is written to the VM’s console intermittently.

badblocks -v /dev/sdb is spitting out numbers on numbers …

smartctl --all /dev/sdb is as follows:

smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.19.0+1] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 870 EVO 2TB
Serial Number: S5Y3NG0R102751Y
LU WWN Device Id: 5 002538 f71104465
Firmware Version: SVT01B6Q
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: Unknown(0x09fc), ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA >3.2 (0x1ff), 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon May 16 21:14:52 2022 AEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 160) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 083 083 010 Pre-fail Always - 335
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 10519
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 60
177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 3
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 083 083 010 Pre-fail Always - 335
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 083 083 010 Pre-fail Always - 335
187 Reported_Uncorrect 0x0032 098 098 000 Old_age Always - 19010
190 Airflow_Temperature_Cel 0x0032 050 019 000 Old_age Always - 50
195 Hardware_ECC_Recovered 0x001a 199 199 000 Old_age Always - 19010
199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 34
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 5521858648

SMART Error Log Version: 1
ATA Error Count: 19010 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.

Error 19010 occurred at disk power-on lifetime: 10519 hours (438 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH


40 51 08 50 a9 be e0 Error: UNC

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name


2f 00 01 30 06 00 e0 16 05:48:42.744 READ LOG EXT
2f 00 01 30 00 00 e0 16 05:48:42.744 READ LOG EXT
2f 00 01 00 00 00 e0 16 05:48:42.744 READ LOG EXT
2f 00 01 30 08 00 e0 16 05:48:42.744 READ LOG EXT
2f 00 01 13 00 00 e0 16 05:48:42.744 READ LOG EXT

Error 19009 occurred at disk power-on lifetime: 10519 hours (438 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH


40 51 08 50 a9 be e0 Error: UNC

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name


2f 00 01 30 06 00 e0 16 05:48:41.718 READ LOG EXT
2f 00 01 30 00 00 e0 16 05:48:41.718 READ LOG EXT
2f 00 01 00 00 00 e0 16 05:48:41.718 READ LOG EXT
2f 00 01 30 08 00 e0 16 05:48:41.718 READ LOG EXT
2f 00 01 13 00 00 e0 16 05:48:41.718 READ LOG EXT

Error 19008 occurred at disk power-on lifetime: 10519 hours (438 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH


40 51 08 50 a9 be e0 Error: UNC

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name


2f 00 01 30 06 00 e0 16 05:48:41.121 READ LOG EXT
2f 00 01 30 00 00 e0 16 05:48:41.121 READ LOG EXT
2f 00 01 00 00 00 e0 16 05:48:41.121 READ LOG EXT
2f 00 01 30 08 00 e0 16 05:48:41.121 READ LOG EXT
2f 00 01 13 00 00 e0 16 05:48:41.121 READ LOG EXT

Error 19007 occurred at disk power-on lifetime: 10519 hours (438 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH


40 51 08 50 a9 be e0 Error: UNC

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name


2f 00 01 30 06 00 e0 16 05:48:39.993 READ LOG EXT
2f 00 01 30 00 00 e0 16 05:48:39.993 READ LOG EXT
2f 00 01 00 00 00 e0 16 05:48:39.993 READ LOG EXT
2f 00 01 30 08 00 e0 16 05:48:39.993 READ LOG EXT
2f 00 01 13 00 00 e0 16 05:48:39.993 READ LOG EXT

Error 19006 occurred at disk power-on lifetime: 10519 hours (438 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH


40 51 08 50 a9 be e0 Error: UNC

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name


2f 00 01 30 06 00 e0 16 05:48:38.857 READ LOG EXT
2f 00 01 30 00 00 e0 16 05:48:38.857 READ LOG EXT
2f 00 01 00 00 00 e0 16 05:48:38.857 READ LOG EXT
2f 00 01 30 08 00 e0 16 05:48:38.857 READ LOG EXT
2f 00 01 13 00 00 e0 16 05:48:38.857 READ LOG EXT

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

The drive is just over a year old.

Is there any SSD-fortune-tellers than can advise on the device’s remaining life expectancy ?